{"title":"碳纳米管层的电子反射特征","authors":"N. V. Novikov, N. G. Chechenin, A. A. Shirokova","doi":"10.1134/S1027451024020162","DOIUrl":null,"url":null,"abstract":"<p>In this paper, we study the anisotropic properties of a layer of carbon nanotubes upon electron reflection. Only a small proportion of the incident electrons is found to be reflected from a target with a surface layer of oriented carbon nanotubes. Reflection occurs only from a layer of horizontally oriented nanotubes at an incidence angle greater than 80° and vertically oriented nanotubes at an incidence angle less than 10°. The effect is explained by the peculiarities of the formation of an electron flow in the surface layers of the target.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 2","pages":"264 - 267"},"PeriodicalIF":0.5000,"publicationDate":"2024-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Features of Electron Reflection by a Layer of Carbon Nanotubes\",\"authors\":\"N. V. Novikov, N. G. Chechenin, A. A. Shirokova\",\"doi\":\"10.1134/S1027451024020162\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>In this paper, we study the anisotropic properties of a layer of carbon nanotubes upon electron reflection. Only a small proportion of the incident electrons is found to be reflected from a target with a surface layer of oriented carbon nanotubes. Reflection occurs only from a layer of horizontally oriented nanotubes at an incidence angle greater than 80° and vertically oriented nanotubes at an incidence angle less than 10°. The effect is explained by the peculiarities of the formation of an electron flow in the surface layers of the target.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"18 2\",\"pages\":\"264 - 267\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2024-05-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451024020162\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024020162","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
Features of Electron Reflection by a Layer of Carbon Nanotubes
In this paper, we study the anisotropic properties of a layer of carbon nanotubes upon electron reflection. Only a small proportion of the incident electrons is found to be reflected from a target with a surface layer of oriented carbon nanotubes. Reflection occurs only from a layer of horizontally oriented nanotubes at an incidence angle greater than 80° and vertically oriented nanotubes at an incidence angle less than 10°. The effect is explained by the peculiarities of the formation of an electron flow in the surface layers of the target.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.