在纳米多孔基底上形成纳米铋粒子

S. I. Supelnyak, V. V. Artemov
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引用次数: 0

摘要

摘要--通过一段式和二段式阳极氧化,获得了具有阳极氧化铝层的基板。样品的体积和表面具有不同的孔隙率。铋纳米粒子是在氩气介质中通过热蒸发凝结在带有阳极氧化铝层的基底上获得的。通过扫描电子显微镜获得的图像研究了纳米颗粒和微颗粒的大小、形状和数量分布。在表面有一层无孔氧化铝的样品上,纳米粒子数量最多(21%),直径为 70 纳米。据推测,表面孔隙的存在会影响沉积原子和铋熔体颗粒的迁移,直至形成稳定的凝结中心。直径从 20 纳米到 100 纳米的孔隙的存在导致最常见的铋纳米粒子的直径从 80 纳米减小到 40 纳米。在孔径为 60 至 220 纳米的样品中,直径为 90 纳米的纳米颗粒占多数(25%)。所有基底上数量最多的球形晶体直径为 110 纳米。研究发现,表面未进行化学抛光的样品中的颗粒分布均匀。
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Formation of Bismuth Nanoparticles on Nanoporous Substrates

Abstract

Substrates with a layer of anodized aluminum oxide are obtained by one-stage and two-stage anodization. The samples have different porosity in volume and on the surface. Bismuth nanoparticles are obtained by thermal evaporation in an argon medium by condensation onto substrates with a layer of anodized aluminum oxide. The distribution of sizes, shapes, and the quantity of nanoparticles and microparticles is studied from images obtained using a scanning electron microscope. The largest number of nanoparticles (21%) on the sample with a surface layer of aluminum oxide without pores is characterized by a diameter of 70 nm. It is assumed that the presence of pores on the surface affects the migration of deposited atoms and particles of bismuth melt until stable condensation centers are formed. The presence of pores with a diameter from 20 to 100 nm leads to a decrease in the diameter of the most common bismuth nanoparticles from 80 to 40 nm. Nanoparticles with a diameter of 90 nm predominate (25%) in the sample with pores with a diameter from 60 to 220 nm. The largest number of spherical crystallites on all substrates has a diameter of 110 nm. It is found that a uniform distribution of particles is obtained for the sample, whose surface was not subjected to chemical polishing.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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