E. G. Nikonov, R. G. Nazmitdinov, P. I. Glukhovtsev
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引用次数: 0
摘要
摘要 准二维系统在制造满足纳米电子学需求的各种器件中发挥着重要作用。显然,这类系统的功能效率取决于其结构,而在相变过程中,结构会在外部条件(如温度)的影响下发生变化。迄今为止,人们的主要注意力都集中在寻找连续二维系统中的相变信号上。其中一个核心问题是分析此类体系中六方相成核的条件,在一定温度下,六方相会伴随着维格纳晶体相缺陷的出现。然而,在所考虑的体系中,临界电子数在多大程度上会开始破坏晶格的对称性,从而导致缺陷成核,这既是实际问题,也是基本问题。我们研究了零温度下表征拓扑相变的定向有序参数和相关函数与粒子数量的函数关系。以 N = 92、136 和 187 为例,通过计算结果,我们确定了从六方相到六方相的相变前兆。
Manifestation of the Hexatic Phase in Confined Two-Dimensional Systems with Circular Symmetry
Quasi-two-dimensional systems play an important role in the manufacture of various devices for the needs of nanoelectronics. Obviously, the functional efficiency of such systems depends on their structure, which can change during phase transitions under the influence of external conditions (e.g., temperature). Until now, the main attention has been focused on the search for signals of phase transitions in continuous two-dimensional systems. One of the central issues is the analysis of conditions for the nucleation of the hexatic phase in such systems, which is accompanied by the appearance of defects in the Wigner crystalline phase at a certain temperature. However, both practical and fundamental questions arise about the critical number of electrons at which the symmetry of the crystal lattice in the system under consideration will begin to break and, consequently, the nucleation of defects will start. The dependences of the orientational order parameter and the correlation function, which characterize topological phase transitions, as functions of the number of particles at zero temperature have been studied. The calculation results allow us to establish the precursors of the phase transition from the hexagonal phase to the hexatic one for N = 92, 136, and 187 considered as an example.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.