加速电子束与介质表面滑动相互作用时的电磁辐射

L. A. Zhilyakov, V. S. Kulikauskas
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引用次数: 0

摘要

摘要 这项工作旨在研究 "导引 "效应的特性,即在导引加速电子束时产生电磁辐射的可能性。本文讨论了电子束与电介质表面相互作用时电子导向的运动模型。我们注意到,当电子束被外部横向电场压向电介质表面时,在这种情况下,由于导向效应,电子在沿表面运动时会产生横向振动。因此,电子在横向方向上的运动被加速,相应地,电子束在导向情况下应成为电磁辐射源,类似于起伏器和摇摆器的辐射。工作中使用拉莫尔公式进行的数值估算表明,这种辐射的功率值应足以进行实验检测。在连续辐射的背景下,这种辐射应该是脉冲性质的。脉冲辐射的功率必须比连续背景辐射的功率大几个数量级。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Electromagnetic Radiation of Accelerated Electron Beams During Sliding Interaction with a Dielectric Surface

The work is aimed at studying the properties of the “guiding” effect, namely the possibility of generating electromagnetic radiation when guiding beams of accelerated electrons. In this paper, we discuss a model of motion for the case of electron guiding during the interaction of electron beams with a dielectric surface. It is noted that when an electron beam is pressed against the surface of a dielectric by an external transverse electric field, in this case, due to the guiding effect, the electrons experience transverse vibrations when moving along the surface. Consequently, the movement of electrons in the transverse direction is accelerated and, accordingly, electron beams in the case of guiding should be a source of electromagnetic radiation, similar to the radiation of undulators and wigglers. The numerical estimates carried out in the work using the Larmor formula show that the power of this radiation should have a value sufficient for its experimental detection. This radiation should be of a pulsed nature against the background of continuous radiation. The power of the pulsed radiation must be several orders of magnitude greater than the power of the continuous background radiation.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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