Bi2Te3-Sb2Te3 晶体中的电子-普拉斯门相互作用

N. P. Stepanov
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引用次数: 0

摘要

摘要 在研究对型 Bi2Te3-Sb2Te3 固溶体在红外范围内的光学特性时发现,在单晶 Bi0.6Sb1.4Te3 中,在观察自由电荷载流子等离子体共振的频率范围内,反射系数光谱发生了变形。等离子体边缘的变形随着温度的降低而增加。利用实验反射光谱的克拉默-克罗尼格色散关系,计算了介电常数函数实部ε1 和虚部ε2 的光谱依赖关系,以及表征能量耗散率的能量损失函数。发现了能量损耗函数峰值的分裂,这表明电子系统中发生的另一个过程对等离子体共振产生了影响。这种过程是电子在价带的非等效极值之间的转变。电子系统的集合能量和单粒子能量的趋同导致了电子-等离子相互作用的放大,这是观测到的等离子体边缘变形的最可能原因。
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Electron–Plasmon Interaction in Bi2Te3–Sb2Te3 Crystals

Abstract

Upon studying the optical properties of solid solutions of p-type Bi2Te3–Sb2Te3 in the infrared range, it is found that in the single crystal Bi0.6Sb1.4Te3, deformation of the reflection-coefficient spectra is observed in the frequency range of observation of the plasma resonance of free charge carriers. Deformation of the plasma edge increases with a decrease in temperature. Using the Kramers–Kronig dispersion relations from experimental reflection spectra, the spectral dependences of the real ε1 and imaginary parts ε2 of the permittivity function, as well as the energy-loss function characterizing the rate of energy dissipation, are calculated. Splitting of the peak of the energy loss function is found, which indicates the effect on the plasma resonance from another process occurring in the electronic system. It is established that such a process is the transition of electrons between nonequivalent extrema of the valence band. Convergence of the collective and single-particle energies of the electronic system leads to amplification of the electron—plasmon interaction, which is the most probable cause of the observed deformation of the plasma edge.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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