利用气-液-固机制在金催化剂作用下生长直径可控的 Sb2Te3 纳米线

N. Swaikat, R. Alabada, A. S. Samofalova
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摘要

摘要 本文介绍了使用金催化剂,通过化学气相沉积法在硅基底上生长具有相变和可控直径的 Sb2Te3 瑀纳米线的结果。除了金催化剂的尺寸外,初始 Sb2Te3 粉末的量也可用于控制 Sb2Te3 纳米线的直径。Sb2Te3 纳米线的直径明显随着金催化剂尺寸和 Sb2Te3 粉末量的增加而增大。通过有效控制金纳米粒子的尺寸和 Sb2Te3 粉末的用量,Sb2Te3 纳米线的直径可控制在 145 至 275 nm 的大范围内。根据吉布斯-汤姆逊效应,从过饱和的角度详细揭示了金纳米粒子的大小和 Sb2Te3 粉末的用量对 Sb2Te3 纳米线直径的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Diameter-Controlled Growth of Sb2Te3 Nanowires with Au Catalyst by the Vapor–Liquid–Solid Mechanism

This paper presents the results of growing chalcogenide nanowires of Sb2Te3 with a phase transition and a controlled diameter on Si substrates by the chemical vapor deposition method using an Au catalyst. In addition to the size of the Au catalyst, the amount of the initial Sb2Te3 powder is also used to control the diameter of Sb2Te3 nanowires. The diameter of the Sb2Te3 nanowires clearly increases with both the size of the Au catalyst and the amount of the Sb2Te3 powder. By effectively controlling the size of Au nanoparticles and the amount of the Sb2Te3 powder, the diameter of the Sb2Te3 nanowires can be controlled in a wide range from 145 to 275 nm. The influence of the size of Au nanoparticles and the amount of the Sb2Te3 powder on the diameter of the Sb2Te3 nanowires is revealed in terms of supersaturation, based in detail on the Gibbs–Thomson effect.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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