用于氨电感应的硫化镉量子点-聚噻吩纳米复合材料

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-08-30 DOI:10.1007/s10854-024-13394-7
Pooja L. Chaudhary, Parag V. Adhyapak
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引用次数: 0

摘要

量子点(QDs)是一种尺寸在 1 纳米到 10 纳米之间的零维半导体纳米材料。它们具有高光稳定性、高量子产率、优异的光致发光特性、高表面体积比和可调尺寸约束效应等特性。本报告以柠檬酸为封端剂,采用水热法合成了荧光硫化镉量子点(CdS QDs)。使用噻吩单体通过氧化聚合工艺制备了聚噻吩(PTH)。将 CdS QDs 与 PTh 按不同比例混合,通过原位法获得了 CdS QDs 和 PTh 的纳米复合材料。利用不同的表征技术对制备的产品进行了表征。对 CdS QDs、PTH 及其纳米复合材料进行了气体电传感测试。等体积比例负载的 CdS QDs-PTh 纳米复合材料对氨气的灵敏度在 100 ppm 和 130 ppm 时分别达到约 38% 和 48%。传感器的响应时间小于 1 秒,恢复时间在 4 到 8 秒之间。
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Cadmium sulfide quantum dots-polythiophene nanocomposite for electrical ammonia sensing

Quantum dots (QDs) are zero-dimensional semiconducting nanomaterial of size ranging from 1 to 10 nm. They exhibit properties like high photostability, high quantum yield, excellent photoluminescence properties, high surface-to-volume ratio, and tunable size confinement effect. In this report, fluorescent cadmium sulfide quantum dots (CdS QDs) have been synthesized using hydrothermal method with citric acid as a capping agent. Polythiophene (PTh) was prepared by oxidative polymerization process using thiophene monomer. Nanocomposites of CdS QDs and PTh were obtained through ex situ method by mixing CdS QDs with PTh in different proportions. The as-prepared products have been characterized using different characterization techniques. The CdS QDs, PTh, and their nanocomposites were tested for electrical gas sensing. Maximum sensitivity of ~ 38% for 100 ppm and ~ 48% for 130 ppm were obtained toward ammonia for equal volume proportion-loaded CdS QDs-PTh nanocomposite. The response time observed less than 1 s and recovery time was in between 4 and 8 s. The sensor shows linear response which is useful for device fabrication.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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