L. Arabskyj, B. Dejen, T. S. Santana, M. Lucamarini, C. J. Chunnilall, P. R. Dolan
{"title":"市售自由空间硅单光子雪崩二极管的干扰效应","authors":"L. Arabskyj, B. Dejen, T. S. Santana, M. Lucamarini, C. J. Chunnilall, P. R. Dolan","doi":"10.1063/5.0225337","DOIUrl":null,"url":null,"abstract":"Single-photon avalanche diodes (SPADs) are essential for photon-based measurements and metrology, enabling measurement comparisons at the few-photon level and facilitating global traceability to the SI. A spatially uniform detector response is crucial for these applications. Here, we report on interference effects in commercially available silicon SPADs that are detrimental to their spatial uniformity. Contrasts as high as 18% are observed, posing problems for metrology and general applications that utilize coherent light and require stable detection efficiencies. We eliminate the device optical window as a contributing interface, isolating likely causes to anti-reflective coatings, the semiconductor surface, and the SPAD's internal structure. We also present results where we leverage this sub-optimal behavior by aligning an incident beam with the position of maximum constructive interference, yielding an effective detection efficiency of 51.1(1.7)% compared to the normal value of 44.3(1)% obtained with the interference suppressed. We anticipate that this work will significantly impact the continuing development of these devices, the methods for characterizing them, and their use in accurate measurements.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":null,"pages":null},"PeriodicalIF":3.5000,"publicationDate":"2024-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Interference effects in commercially available free-space silicon single-photon avalanche diodes\",\"authors\":\"L. Arabskyj, B. Dejen, T. S. Santana, M. Lucamarini, C. J. Chunnilall, P. R. Dolan\",\"doi\":\"10.1063/5.0225337\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single-photon avalanche diodes (SPADs) are essential for photon-based measurements and metrology, enabling measurement comparisons at the few-photon level and facilitating global traceability to the SI. A spatially uniform detector response is crucial for these applications. Here, we report on interference effects in commercially available silicon SPADs that are detrimental to their spatial uniformity. Contrasts as high as 18% are observed, posing problems for metrology and general applications that utilize coherent light and require stable detection efficiencies. We eliminate the device optical window as a contributing interface, isolating likely causes to anti-reflective coatings, the semiconductor surface, and the SPAD's internal structure. We also present results where we leverage this sub-optimal behavior by aligning an incident beam with the position of maximum constructive interference, yielding an effective detection efficiency of 51.1(1.7)% compared to the normal value of 44.3(1)% obtained with the interference suppressed. We anticipate that this work will significantly impact the continuing development of these devices, the methods for characterizing them, and their use in accurate measurements.\",\"PeriodicalId\":8094,\"journal\":{\"name\":\"Applied Physics Letters\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2024-11-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics Letters\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0225337\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0225337","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
Interference effects in commercially available free-space silicon single-photon avalanche diodes
Single-photon avalanche diodes (SPADs) are essential for photon-based measurements and metrology, enabling measurement comparisons at the few-photon level and facilitating global traceability to the SI. A spatially uniform detector response is crucial for these applications. Here, we report on interference effects in commercially available silicon SPADs that are detrimental to their spatial uniformity. Contrasts as high as 18% are observed, posing problems for metrology and general applications that utilize coherent light and require stable detection efficiencies. We eliminate the device optical window as a contributing interface, isolating likely causes to anti-reflective coatings, the semiconductor surface, and the SPAD's internal structure. We also present results where we leverage this sub-optimal behavior by aligning an incident beam with the position of maximum constructive interference, yielding an effective detection efficiency of 51.1(1.7)% compared to the normal value of 44.3(1)% obtained with the interference suppressed. We anticipate that this work will significantly impact the continuing development of these devices, the methods for characterizing them, and their use in accurate measurements.
期刊介绍:
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics.
APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field.
Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.