{"title":"掺 Tm 的 Ca3TaGa3Si2O14 单晶的光学和闪烁特性","authors":"Ryosei Takahashi, Kai Okazaki, Daisuke Nakauchi, Takumi Kato, Noriaki Kawaguchi, Takayuki Yanagida","doi":"10.1007/s10854-024-13907-4","DOIUrl":null,"url":null,"abstract":"<div><p>Undoped and Tm-doped Ca<sub>3</sub>TaGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub> (CTGS) single crystals were synthesized by the floating-zone method, and their photoluminescence (PL) and scintillation properties were investigated. The Tm-doped samples showed PL and scintillation due to 4<i>f</i>–4<i>f</i> transitions of Tm<sup>3+</sup>. The PL quantum yields of the 0.1, 0.5, 1, and 2% Tm-doped CTGS samples were, respectively, 4.2, 28.2, 27.6, and 8.3% when excited at 360 nm. The afterglow levels at 20 ms after X-ray irradiation of all the samples were 10–83 ppm. The 0.1, 0.5, and 1% Tm-doped CTGS samples, respectively, showed the light yields of 1300, 1800, and 1500 photons/MeV under γ-ray irradiation.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"35 34","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2024-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Optical and scintillation properties of Tm-doped Ca3TaGa3Si2O14 single crystals\",\"authors\":\"Ryosei Takahashi, Kai Okazaki, Daisuke Nakauchi, Takumi Kato, Noriaki Kawaguchi, Takayuki Yanagida\",\"doi\":\"10.1007/s10854-024-13907-4\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Undoped and Tm-doped Ca<sub>3</sub>TaGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub> (CTGS) single crystals were synthesized by the floating-zone method, and their photoluminescence (PL) and scintillation properties were investigated. The Tm-doped samples showed PL and scintillation due to 4<i>f</i>–4<i>f</i> transitions of Tm<sup>3+</sup>. The PL quantum yields of the 0.1, 0.5, 1, and 2% Tm-doped CTGS samples were, respectively, 4.2, 28.2, 27.6, and 8.3% when excited at 360 nm. The afterglow levels at 20 ms after X-ray irradiation of all the samples were 10–83 ppm. The 0.1, 0.5, and 1% Tm-doped CTGS samples, respectively, showed the light yields of 1300, 1800, and 1500 photons/MeV under γ-ray irradiation.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"35 34\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-11-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-024-13907-4\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-13907-4","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Optical and scintillation properties of Tm-doped Ca3TaGa3Si2O14 single crystals
Undoped and Tm-doped Ca3TaGa3Si2O14 (CTGS) single crystals were synthesized by the floating-zone method, and their photoluminescence (PL) and scintillation properties were investigated. The Tm-doped samples showed PL and scintillation due to 4f–4f transitions of Tm3+. The PL quantum yields of the 0.1, 0.5, 1, and 2% Tm-doped CTGS samples were, respectively, 4.2, 28.2, 27.6, and 8.3% when excited at 360 nm. The afterglow levels at 20 ms after X-ray irradiation of all the samples were 10–83 ppm. The 0.1, 0.5, and 1% Tm-doped CTGS samples, respectively, showed the light yields of 1300, 1800, and 1500 photons/MeV under γ-ray irradiation.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.