{"title":"采用反取代生长新途径制备了基于β-Ga2O3/GaN异质结的高性能紫外光电探测器","authors":"Yurui Han, Yuefei Wang, Chong Gao, Shihao Fu, WeiZhe Cui, Zhe Wu, Bingsheng Li, Aidong Shen, Yichun Liu","doi":"10.1016/j.jmst.2024.11.032","DOIUrl":null,"url":null,"abstract":"A broad-spectrum UV photodetector with ultrahigh detectivity and rapid response speed has been achieved in <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction, in which, the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> is synthesized by substituting oxygen for nitrogen in the top layer of the GaN matrix at high temperature. The processes and mechanism of transforming GaN with varying crystal quality into <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> at high temperatures were studied in detail. The newly formed oxide layer is a monoclinic <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> with (<span><math><mover accent=\"true\" is=\"true\"><mn is=\"true\">2</mn><mo is=\"true\">¯</mo></mover></math></span>01) preferred orientation. X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) measurements identified oxygen vacancies and surface flatness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>, respectively, which are closely related to the crystal quality of GaN. The oxygen vacancies and the root mean square of morphology roughness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> decrease with the improvement of the precursor GaN crystal quality. The cross-section transmission electron microscope (TEM) measurements showed that a hexagonal phase GaN<sub>x</sub>O<sub>3(1−x)/2</sub> intermediate layer with a thickness of 5 nm exists at the interface region between <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> and hexagonal GaN. This indicates a molecular reconfiguration of the hexagonal system to a monoclinic system with oxygen substitution of nitrogen in GaN matrix. The metal-semiconductor-metal (MSM) planar structure device achieved an ultrahigh detection capability (Responsivity=2493.5 A/W, Detectivity>10<sup>16</sup> Jones). The response time is in the order of milliseconds (τ<sub>r</sub>=0.27 ms, τ<sub>d1/</sub>τ<sub>d2</sub>=0.33 ms/4.3 ms). A self-powered UV optoelectronic rapid response (τ<sub>r</sub>=5 μs, τ<sub>d1/</sub>τ<sub>d2</sub>=0.13 ms/2.3 ms) with the responsivity of 0.6 mA/W and the detectivity of 5.3×10<sup>11</sup> Jones in the solar-blind wavelength region has been observed in the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction without external bias. With a bias of −10 V loading, the response of the photodetector becomes a broad spectrum, covering the UVA-UVC wavelength range, and the photoresponsivity is up to 13.5 A/W. The detectivity reaches a high value of 2.6×10<sup>15</sup> Jones.","PeriodicalId":16154,"journal":{"name":"Journal of Materials Science & Technology","volume":"49 1","pages":""},"PeriodicalIF":11.2000,"publicationDate":"2024-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High-performance UV photodetector based on β-Ga2O3/GaN heterojunction prepared by a new route of reverse substitution growth\",\"authors\":\"Yurui Han, Yuefei Wang, Chong Gao, Shihao Fu, WeiZhe Cui, Zhe Wu, Bingsheng Li, Aidong Shen, Yichun Liu\",\"doi\":\"10.1016/j.jmst.2024.11.032\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A broad-spectrum UV photodetector with ultrahigh detectivity and rapid response speed has been achieved in <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction, in which, the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> is synthesized by substituting oxygen for nitrogen in the top layer of the GaN matrix at high temperature. The processes and mechanism of transforming GaN with varying crystal quality into <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> at high temperatures were studied in detail. The newly formed oxide layer is a monoclinic <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> with (<span><math><mover accent=\\\"true\\\" is=\\\"true\\\"><mn is=\\\"true\\\">2</mn><mo is=\\\"true\\\">¯</mo></mover></math></span>01) preferred orientation. X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) measurements identified oxygen vacancies and surface flatness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>, respectively, which are closely related to the crystal quality of GaN. The oxygen vacancies and the root mean square of morphology roughness of <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> decrease with the improvement of the precursor GaN crystal quality. The cross-section transmission electron microscope (TEM) measurements showed that a hexagonal phase GaN<sub>x</sub>O<sub>3(1−x)/2</sub> intermediate layer with a thickness of 5 nm exists at the interface region between <em>β</em>-Ga<sub>2</sub>O<sub>3</sub> and hexagonal GaN. This indicates a molecular reconfiguration of the hexagonal system to a monoclinic system with oxygen substitution of nitrogen in GaN matrix. The metal-semiconductor-metal (MSM) planar structure device achieved an ultrahigh detection capability (Responsivity=2493.5 A/W, Detectivity>10<sup>16</sup> Jones). The response time is in the order of milliseconds (τ<sub>r</sub>=0.27 ms, τ<sub>d1/</sub>τ<sub>d2</sub>=0.33 ms/4.3 ms). A self-powered UV optoelectronic rapid response (τ<sub>r</sub>=5 μs, τ<sub>d1/</sub>τ<sub>d2</sub>=0.13 ms/2.3 ms) with the responsivity of 0.6 mA/W and the detectivity of 5.3×10<sup>11</sup> Jones in the solar-blind wavelength region has been observed in the <em>β</em>-Ga<sub>2</sub>O<sub>3</sub>/GaN heterojunction without external bias. With a bias of −10 V loading, the response of the photodetector becomes a broad spectrum, covering the UVA-UVC wavelength range, and the photoresponsivity is up to 13.5 A/W. The detectivity reaches a high value of 2.6×10<sup>15</sup> Jones.\",\"PeriodicalId\":16154,\"journal\":{\"name\":\"Journal of Materials Science & Technology\",\"volume\":\"49 1\",\"pages\":\"\"},\"PeriodicalIF\":11.2000,\"publicationDate\":\"2024-12-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science & Technology\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1016/j.jmst.2024.11.032\",\"RegionNum\":1,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science & Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1016/j.jmst.2024.11.032","RegionNum":1,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
摘要
在β-Ga2O3/GaN异质结中实现了具有超高探测率和快速响应速度的宽光谱紫外光探测器,其中,β-Ga2O3是在高温下通过在GaN基体顶层以氧代氮合成的。详细研究了不同晶体质量的氮化镓在高温下转化为β-Ga2O3的过程和机理。新形成的氧化层是具有 (2¯01) 优选取向的单斜β-Ga2O3。X 射线光电子能谱(XPS)和原子力显微镜(AFM)测量分别确定了β-Ga2O3 的氧空位和表面平整度,这与 GaN 的晶体质量密切相关。随着前驱体 GaN 晶体质量的提高,β-Ga2O3 的氧空位和形貌粗糙度的均方根值也在降低。横截面透射电子显微镜(TEM)测量结果表明,在β-Ga2O3 和六方 GaN 的界面区域存在厚度为 5 纳米的六方相 GaNxO3(1-x)/2 中间层。这表明在氮化镓基体中,六方体系在氧取代氮的作用下发生了分子重构,变成了单斜体系。金属-半导体-金属(MSM)平面结构器件实现了超高探测能力(响应率=2493.5 A/W,探测率>1016 Jones)。响应时间为毫秒级(τr=0.27 ms,τd1/τd2=0.33 ms/4.3 ms)。在没有外部偏压的情况下,β-Ga2O3/GaN 异质结观察到了自供电紫外光电快速响应(τr=5 μs,τd1/τd2=0.13 ms/2.3 ms),在太阳盲波长区域的响应率为 0.6 mA/W,探测率为 5.3×1011 Jones。加载 -10 V 的偏压后,光电探测器的响应变成了宽光谱,覆盖了 UVA-UVC 波长范围,光致发光率高达 13.5 A/W。检测率高达 2.6×1015 琼斯。
High-performance UV photodetector based on β-Ga2O3/GaN heterojunction prepared by a new route of reverse substitution growth
A broad-spectrum UV photodetector with ultrahigh detectivity and rapid response speed has been achieved in β-Ga2O3/GaN heterojunction, in which, the β-Ga2O3 is synthesized by substituting oxygen for nitrogen in the top layer of the GaN matrix at high temperature. The processes and mechanism of transforming GaN with varying crystal quality into β-Ga2O3 at high temperatures were studied in detail. The newly formed oxide layer is a monoclinic β-Ga2O3 with (01) preferred orientation. X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) measurements identified oxygen vacancies and surface flatness of β-Ga2O3, respectively, which are closely related to the crystal quality of GaN. The oxygen vacancies and the root mean square of morphology roughness of β-Ga2O3 decrease with the improvement of the precursor GaN crystal quality. The cross-section transmission electron microscope (TEM) measurements showed that a hexagonal phase GaNxO3(1−x)/2 intermediate layer with a thickness of 5 nm exists at the interface region between β-Ga2O3 and hexagonal GaN. This indicates a molecular reconfiguration of the hexagonal system to a monoclinic system with oxygen substitution of nitrogen in GaN matrix. The metal-semiconductor-metal (MSM) planar structure device achieved an ultrahigh detection capability (Responsivity=2493.5 A/W, Detectivity>1016 Jones). The response time is in the order of milliseconds (τr=0.27 ms, τd1/τd2=0.33 ms/4.3 ms). A self-powered UV optoelectronic rapid response (τr=5 μs, τd1/τd2=0.13 ms/2.3 ms) with the responsivity of 0.6 mA/W and the detectivity of 5.3×1011 Jones in the solar-blind wavelength region has been observed in the β-Ga2O3/GaN heterojunction without external bias. With a bias of −10 V loading, the response of the photodetector becomes a broad spectrum, covering the UVA-UVC wavelength range, and the photoresponsivity is up to 13.5 A/W. The detectivity reaches a high value of 2.6×1015 Jones.
期刊介绍:
Journal of Materials Science & Technology strives to promote global collaboration in the field of materials science and technology. It primarily publishes original research papers, invited review articles, letters, research notes, and summaries of scientific achievements. The journal covers a wide range of materials science and technology topics, including metallic materials, inorganic nonmetallic materials, and composite materials.