{"title":"基底温度对雾化喷雾热解法制备(222)取向CdIn2O4薄膜物理性能的影响","authors":"B. Balayazhini, S. Sahul Hameed, J. Raj Mohamed","doi":"10.1007/s10854-024-14200-0","DOIUrl":null,"url":null,"abstract":"<div><p>The cadmium indium oxide thin film (CdIn<sub>2</sub>O<sub>4</sub>) was formed onto a micro glass substrate using the nebulized spray pyrolysis process at substrate temperatures ranging from 350 to 550 °C with a 50 °C interval. The X-ray diffraction investigation revealed the polycrystalline nature of the films with a cubic structure and the preferred orientation along the (222) plane. The optical transmission and optical spectra were obtained using optical analysis and the multiple interference effect was significant in all of these films within the wavelength range of 300–1100 nm. These films were highly adhesive, homogeneous, and shining. Bandgap values ranging from 2.71 to 3.37 eV with direct allowed nature were obtained. The Urbach energy values and skin depth were observed for all the films. The surface ratio of the elements was analyzed using the EDAX spectrum. Scanning electron microscope images exhibited flower-shaped grains. Photoluminescence spectra at room temperature explain the four emission bands in all the samples, such as the sharp dominant peak at 490 nm in the UV–visible region. The electrical parameters were analyzed; the minimum resistivity was 0.51 × 102 Ω cm, and the mobility was 158 cm<sup>2</sup>/Vs for the film deposited at the substrate temperature of 500 °C.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 2","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-01-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of substrate temperature on the physical properties of (222) oriented CdIn2O4 thin films by nebulized spray pyrolysis technique\",\"authors\":\"B. Balayazhini, S. Sahul Hameed, J. Raj Mohamed\",\"doi\":\"10.1007/s10854-024-14200-0\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The cadmium indium oxide thin film (CdIn<sub>2</sub>O<sub>4</sub>) was formed onto a micro glass substrate using the nebulized spray pyrolysis process at substrate temperatures ranging from 350 to 550 °C with a 50 °C interval. The X-ray diffraction investigation revealed the polycrystalline nature of the films with a cubic structure and the preferred orientation along the (222) plane. The optical transmission and optical spectra were obtained using optical analysis and the multiple interference effect was significant in all of these films within the wavelength range of 300–1100 nm. These films were highly adhesive, homogeneous, and shining. Bandgap values ranging from 2.71 to 3.37 eV with direct allowed nature were obtained. The Urbach energy values and skin depth were observed for all the films. The surface ratio of the elements was analyzed using the EDAX spectrum. Scanning electron microscope images exhibited flower-shaped grains. Photoluminescence spectra at room temperature explain the four emission bands in all the samples, such as the sharp dominant peak at 490 nm in the UV–visible region. The electrical parameters were analyzed; the minimum resistivity was 0.51 × 102 Ω cm, and the mobility was 158 cm<sup>2</sup>/Vs for the film deposited at the substrate temperature of 500 °C.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 2\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-01-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-024-14200-0\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-024-14200-0","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Impact of substrate temperature on the physical properties of (222) oriented CdIn2O4 thin films by nebulized spray pyrolysis technique
The cadmium indium oxide thin film (CdIn2O4) was formed onto a micro glass substrate using the nebulized spray pyrolysis process at substrate temperatures ranging from 350 to 550 °C with a 50 °C interval. The X-ray diffraction investigation revealed the polycrystalline nature of the films with a cubic structure and the preferred orientation along the (222) plane. The optical transmission and optical spectra were obtained using optical analysis and the multiple interference effect was significant in all of these films within the wavelength range of 300–1100 nm. These films were highly adhesive, homogeneous, and shining. Bandgap values ranging from 2.71 to 3.37 eV with direct allowed nature were obtained. The Urbach energy values and skin depth were observed for all the films. The surface ratio of the elements was analyzed using the EDAX spectrum. Scanning electron microscope images exhibited flower-shaped grains. Photoluminescence spectra at room temperature explain the four emission bands in all the samples, such as the sharp dominant peak at 490 nm in the UV–visible region. The electrical parameters were analyzed; the minimum resistivity was 0.51 × 102 Ω cm, and the mobility was 158 cm2/Vs for the film deposited at the substrate temperature of 500 °C.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.