{"title":"用飞行时间和光谱响应测量研究非晶硅太阳能电池中不同组成的p/i结","authors":"F. Karg, K. Dietrich, W. Kusian, H. Kausche","doi":"10.1109/PVSC.1988.105677","DOIUrl":null,"url":null,"abstract":"Amorphous p-SiC/Si heterojunctions with carbon or phosphorus buffer layers were investigated by spectral response and delayed field measurements. Both buffer types enhance the carrier lifetime at the interface and the blue response. The compensate for the negative influence of cross-contaminated boron, the primary origin of low blue response. A model of a buffer layer conceived to operate efficiently demonstrated the correlation between the length of the carbon buffer layer and the boron cross contamination. In addition the interface lifetime depends on the deposition sequence. Deposition of undoped SiC onto a-Si:H is associated with shallow electron traps, while the reverse sequence shows a very low interface state density.<<ETX>>","PeriodicalId":10562,"journal":{"name":"Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference","volume":"30 1","pages":"149-153 vol.1"},"PeriodicalIF":0.0000,"publicationDate":"1988-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Investigation of variously composed p/i junctions in amorphous silicon solar cells by time of flight and spectral response measurements\",\"authors\":\"F. Karg, K. Dietrich, W. Kusian, H. Kausche\",\"doi\":\"10.1109/PVSC.1988.105677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Amorphous p-SiC/Si heterojunctions with carbon or phosphorus buffer layers were investigated by spectral response and delayed field measurements. Both buffer types enhance the carrier lifetime at the interface and the blue response. The compensate for the negative influence of cross-contaminated boron, the primary origin of low blue response. A model of a buffer layer conceived to operate efficiently demonstrated the correlation between the length of the carbon buffer layer and the boron cross contamination. In addition the interface lifetime depends on the deposition sequence. Deposition of undoped SiC onto a-Si:H is associated with shallow electron traps, while the reverse sequence shows a very low interface state density.<<ETX>>\",\"PeriodicalId\":10562,\"journal\":{\"name\":\"Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference\",\"volume\":\"30 1\",\"pages\":\"149-153 vol.1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.1988.105677\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1988.105677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of variously composed p/i junctions in amorphous silicon solar cells by time of flight and spectral response measurements
Amorphous p-SiC/Si heterojunctions with carbon or phosphorus buffer layers were investigated by spectral response and delayed field measurements. Both buffer types enhance the carrier lifetime at the interface and the blue response. The compensate for the negative influence of cross-contaminated boron, the primary origin of low blue response. A model of a buffer layer conceived to operate efficiently demonstrated the correlation between the length of the carbon buffer layer and the boron cross contamination. In addition the interface lifetime depends on the deposition sequence. Deposition of undoped SiC onto a-Si:H is associated with shallow electron traps, while the reverse sequence shows a very low interface state density.<>