具有电子能量源滤波器的III-V型mosfet的性能比较

K. Lam, Y. Yeo, G. Liang
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引用次数: 3

摘要

我们使用sp3d5s*全波段紧密结合模型,结合非平衡格林函数量子输运模拟器,评估了两种高能电子滤波MOSFET设计的性能,即超晶格源-扩展(SL) MOSFET和p+/n+源-结(p+n+源)MOSFET。研究了由GaAs和In53Ga47As组成的III-V型半导体异质结,并对sl - mosfet的势垒和阱区长度以及p+n+源mosfet的掺杂浓度和n+区长度等优化参数进行了研究,以了解它们对器件性能参数的影响。在目前的全波段模拟中考虑了电子之间更详细的相互作用。我们优化的SL-MOSFET和p+n+源MOSFET分别实现了离子= 0.81和0.60 mA/μm, SS = 20.9和23.1mV/dec@VDS=0.6V。
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Performance comparison of III-V MOSFETs with source filter for electron energy
We evaluated the performances of two high-energy-electrons filtering MOSFET designs, the superlattice source-extension (SL) MOSFET and the p+/n+ source-junction (p+n+ source) MOSFET, using the sp3d5s* full-band tight-binding model, coupled with a non-equilibrium Green's function quantum transport simulator in the ballistic regime. III-V semicoductor heterojunctions made up of GaAs and In53Ga47As are investigated and the optimizing parameters such as the length of the barrier and well regions for the SL-MOSFETs and the doping concentrations and the length of n+ region for the p+n+ source MOSFETs are varied to understand their effects on the device performance parameters. More detailed interactions between electrons are considered in the present full-band simulations. Our optimized SL-MOSFET and p+n+ source MOSFET achieve ION = 0.81 and 0.60 mA/μm, SS = 20.9 and 23.1mV/dec@VDS=0.6V, respectively.
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