A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot
{"title":"碳纳米管在超锋利硅纳米尖上的高产接枝:力学表征和原子力显微镜成像","authors":"A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot","doi":"10.1109/MEMSYS.2007.4433179","DOIUrl":null,"url":null,"abstract":"The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.","PeriodicalId":6388,"journal":{"name":"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)","volume":"61 1","pages":"851-854"},"PeriodicalIF":0.0000,"publicationDate":"2007-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High yield grafting of carbon nanotube on ultra-sharp silicon nanotips: Mechanical characterization and AFM imaging\",\"authors\":\"A. Rollier, C. Bernard, S. Marsaudon, A. Bonnot, Marc Faucher, J. Aimé, Bernard Legrand, Dominique Collard, L. Buchaillot\",\"doi\":\"10.1109/MEMSYS.2007.4433179\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.\",\"PeriodicalId\":6388,\"journal\":{\"name\":\"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)\",\"volume\":\"61 1\",\"pages\":\"851-854\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MEMSYS.2007.4433179\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE 20th International Conference on Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2007.4433179","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High yield grafting of carbon nanotube on ultra-sharp silicon nanotips: Mechanical characterization and AFM imaging
The novelty of this work lies in the fabrication of nanotips without any facet allowing the high yield of robust carbon nanotube (CNT) grafting for atomic force microscopy (AFM) experiments.