A. Mocuta, P. Weckx, S. Demuynck, D. Radisic, Y. Oniki, J. Ryckaert
{"title":"使CMOS向3nm及以上扩展","authors":"A. Mocuta, P. Weckx, S. Demuynck, D. Radisic, Y. Oniki, J. Ryckaert","doi":"10.1109/VLSIT.2018.8510683","DOIUrl":null,"url":null,"abstract":"We look at several scaling boosters necessary to accomplish CMOS area scaling towards the 2nm node. We consider aspects of standard cell area scaling, transistor architecture, SRAM, and BEOL. We also demonstrate integrated flows and hardware feasibility for such scaling boosters.","PeriodicalId":6561,"journal":{"name":"2018 IEEE Symposium on VLSI Technology","volume":"53 369 1","pages":"147-148"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Enabling CMOS Scaling Towards 3nm and Beyond\",\"authors\":\"A. Mocuta, P. Weckx, S. Demuynck, D. Radisic, Y. Oniki, J. Ryckaert\",\"doi\":\"10.1109/VLSIT.2018.8510683\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We look at several scaling boosters necessary to accomplish CMOS area scaling towards the 2nm node. We consider aspects of standard cell area scaling, transistor architecture, SRAM, and BEOL. We also demonstrate integrated flows and hardware feasibility for such scaling boosters.\",\"PeriodicalId\":6561,\"journal\":{\"name\":\"2018 IEEE Symposium on VLSI Technology\",\"volume\":\"53 369 1\",\"pages\":\"147-148\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE Symposium on VLSI Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIT.2018.8510683\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2018.8510683","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We look at several scaling boosters necessary to accomplish CMOS area scaling towards the 2nm node. We consider aspects of standard cell area scaling, transistor architecture, SRAM, and BEOL. We also demonstrate integrated flows and hardware feasibility for such scaling boosters.