High-density 3D packaging technology for CCD micro-camera system module

H. Yamada, T. Togasaki, M. Kimura, H. Sudo
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引用次数: 3

Abstract

High-density three-dimensional (3D) packaging technology for a CCD micro-camera system module has been developed by applying high-density interconnection stack-unit modules that have fine-pitch flip-chip interconnections within copper-column-based solder bumps and high-aspect-ratio sidewall footprints for vertical interconnections. Copper-column-based solder bump design and underfill encapsulation resin characteristics were optimized to reduce the strain in the bump and to achieve fine-pitch flip-chip interconnection with high reliability. High-aspect-ratio sidewall footprints were realized by the copper-filled stacked vias at the edge of the module substrate. High-precision distribution of sidewall footprints was achieved by laminating the multiple stack-unit substrates simultaneously. The fabricated three-dimensional package has operated satisfactorily as the CCD imaging data transmission circuit module. The technology was confirmed to be effective for incorporating many devices of different sizes at far higher packaging density than it is possible to attain using conventional technology.
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CCD微相机系统模块高密度三维封装技术
采用高密度互连堆叠单元模块,开发了用于CCD微相机系统模块的高密度三维(3D)封装技术。高密度互连堆叠单元模块在铜柱基焊点内具有细间距倒装芯片互连,并且具有用于垂直互连的高纵横比侧壁封装。优化了基于铜柱的凸点设计和下填充封装树脂特性,以减小凸点中的应变,实现高可靠性的细间距倒装芯片互连。通过在模块基板边缘填充铜的堆叠过孔实现了高纵横比的侧壁足迹。通过同时贴合多个堆叠单元基板,实现了侧壁足迹的高精度分布。制作的三维封装作为CCD成像数据传输电路模块运行良好。该技术被证实是有效的合并许多不同尺寸的器件在远高于使用传统技术可能达到的封装密度。
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