Localization and aftereffect of automatic test generation

Proceedings First Asian Test Symposium (ATS `92) Pub Date : 1992-11-26 DOI:10.1109/ATS.1992.224440

Zhongcheng Li, Yuqi Pan, Y. Min

引用次数: 0

Abstract

Improvement on efficiency of test pattern generation (TPG) algorithms for large combinational circuits has long been a major concern. Two new concepts, localization and aftereffect, are introduced to enhance the efficiency. Based on the concepts, three techniques, partial implication, aftereffect of identified undetectable faults and shared sensitization, are adopted in a TPG system, SABATPG. Experiments for the 10 ISCAS benchmark circuits show that the computing time of SABATPG for test generation is 19.42% shorter than that of FAN algorithm.<>

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自动测试生成的定位与后效

提高大型组合电路测试图生成(TPG)算法的效率一直是人们关注的焦点。为了提高效率，引入了定位和后效两个新概念。在此基础上，采用了部分隐含、识别出的不可检测故障的后效和共享敏化三种技术应用于TPG系统——SABATPG。在10个ISCAS基准电路上的实验表明，SABATPG算法的测试生成计算时间比FAN算法缩短了19.42%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings First Asian Test Symposium (ATS `92)

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