A complement-based fast algorithm to generate universal test sets for combinational function blocks

Proceedings First Asian Test Symposium (ATS `92) Pub Date : 1992-11-26 DOI:10.1109/ATS.1992.224439

Beyin Chen, Chung-Len Lee

引用次数: 4

Abstract

A fast algorithm to generate the universal test sets (UTS) for combinational function blocks is presented. The algorithm generates the UTS directly by Shannon-expanding and complementing the function, instead of the conventional truth table enumerating. This significantly reduces the time complexity and the memory requirements. Experimental results show that this algorithm achieves an improvement of 2 approximately 6 orders of magnitude in computational efficiency over that described by B. Sheldon and J.R. Akers (1973). This makes the UTS generation be practical for combinational function blocks.<>

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基于互补的组合功能块通用测试集快速生成算法

提出了一种快速生成组合功能块通用测试集的算法。该算法不采用传统的真值表枚举方法，而是通过函数的香农展开和补全直接生成UTS。这大大降低了时间复杂度和内存需求。实验结果表明，该算法的计算效率比B. Sheldon和J.R. Akers(1973)所描述的算法提高了2 ~ 6个数量级。这使得UTS生成对于组合功能块是实用的。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings First Asian Test Symposium (ATS `92)

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Localization and aftereffect of automatic test generation A practical approach for the diagnosis of a MIMD network A complement-based fast algorithm to generate universal test sets for combinational function blocks A control constrained test scheduling approach for VLSI circuits Techniques for reducing hardware requirement of self checking combinational circuits