Nuo Xu, Jing Wang, Yang Lu, Hong-hyun Park, Bo Fu, Renyu Chen, W. Choi, D. Apalkov, Sungchul Lee, S. Ahn, Yohan Kim, Yutaka Nishizawa, Keun-Ho Lee, Youngkwan Park, E. Jung
{"title":"Physics-based compact modeling framework for state-of-the-art and emerging STT-MRAM technology","authors":"Nuo Xu, Jing Wang, Yang Lu, Hong-hyun Park, Bo Fu, Renyu Chen, W. Choi, D. Apalkov, Sungchul Lee, S. Ahn, Yohan Kim, Yutaka Nishizawa, Keun-Ho Lee, Youngkwan Park, E. Jung","doi":"10.1109/IEDM.2015.7409789","DOIUrl":null,"url":null,"abstract":"A comprehensive compact modeling framework coupling quantum transport with magnetic dynamics has been developed for state-of-the-art and emerging STT-MRAMs. After validation with numerical simulation and experimental results, various transistor-MRAM cell architectures have been studied for their performance and variability. SOT-assisted MRAMs are found to have significant improvement on Erase time over conventional STT-MRAMs.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409789","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
A comprehensive compact modeling framework coupling quantum transport with magnetic dynamics has been developed for state-of-the-art and emerging STT-MRAMs. After validation with numerical simulation and experimental results, various transistor-MRAM cell architectures have been studied for their performance and variability. SOT-assisted MRAMs are found to have significant improvement on Erase time over conventional STT-MRAMs.