S. Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, C. Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee
{"title":"Experimental evaluation of bridge patterns for a high performance microprocessor","authors":"S. Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, C. Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee","doi":"10.1109/VTS.2005.44","DOIUrl":null,"url":null,"abstract":"Silicon evaluation of scan patterns, targeting realistic bridges, for a high performance microprocessor is presented. The practicality of generating realistic bridge patterns is demonstrated. Silicon data, with and without functional fails, and in the presence of n-detect tests are presented. Data points to the value of and efficiency of bridge patterns. Data also shows the advantage of using supplemental bridge patterns when compared with supplemental stuck-at patterns.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.44","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
Silicon evaluation of scan patterns, targeting realistic bridges, for a high performance microprocessor is presented. The practicality of generating realistic bridge patterns is demonstrated. Silicon data, with and without functional fails, and in the presence of n-detect tests are presented. Data points to the value of and efficiency of bridge patterns. Data also shows the advantage of using supplemental bridge patterns when compared with supplemental stuck-at patterns.
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