Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices

S. Bhattacharya, A. Chatterjee
{"title":"Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices","authors":"S. Bhattacharya, A. Chatterjee","doi":"10.1109/VTS.2005.67","DOIUrl":null,"url":null,"abstract":"The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.67","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The recent increase in demand within the wireless user community for short-range, very high rate data transmission (data, video) devices has spurred the growth of a new generation of 4G devices, viz. ultra-wideband (UWB). Due to its wide band of operation (3.1-10.6GHz) and non-conventional transmit/receive scheme (using short-duration, narrow baseband pulses), spectral power leakage to outside frequency bands causes interference with other wireless standards. In this paper, we focus on 'out-of-band' interference testing of UWB devices during production test. Due to stringent FCC spectrum regulations and very low power spectral density levels of the associated signals (-41.3dBm/MHz), production testing for interference is a big challenge and can incur significant test time, resulting in increased test cost. We propose a simple, low-cost test methodology for testing UWB devices. Simulation results are presented for a typical home environment. The channel model used can be easily modified and incorporated in any production test environment. Results show that using simple tests, estimates of 'out-of-band' interference can be obtained easily using the proposed test methodology.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
测量超宽带(UWB)设备“带外”干扰的生产测试方法
最近无线用户群体对短距离、高速率数据传输(数据、视频)设备的需求增加,刺激了新一代4G设备,即超宽带(UWB)的增长。由于其工作频带较宽(3.1-10.6GHz)和非常规的发射/接收方案(使用短持续时间、窄基带脉冲),频谱功率泄漏到频段外会对其他无线标准造成干扰。本文重点研究了超宽带设备在生产测试中的带外干扰测试。由于严格的FCC频谱法规和相关信号的极低功率谱密度水平(-41.3dBm/MHz),干扰的生产测试是一个巨大的挑战,可能会花费大量的测试时间,从而增加测试成本。我们提出了一种简单、低成本的测试方法来测试超宽带设备。给出了典型家庭环境的仿真结果。所使用的通道模型可以在任何生产测试环境中轻松修改和合并。结果表明,使用简单的测试方法,可以很容易地获得“带外”干扰的估计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An economic selecting model for DFT strategies Defect screening using independent component analysis on I/sub DDQ/ Experimental evaluation of bridge patterns for a high performance microprocessor Production test methods for measuring 'out-of-band' interference of ultra wide band (UWB) devices Diagnosis of the failing component in RF receivers through adaptive full-path measurements
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1