C. Parthasarathy, M. Denais, V. Huard, G. Ribes, E. Vincent, A. Bravaix
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引用次数: 8
Abstract
This paper discusses the characterization and modeling methodology for NBTI for subsequent use in reliability simulations. Given the integral recovery post NBTI stress, we use on-the-fly technique to measure degradation. A new and fully experimental means of interpretation of results from OTF is presented. We also present some new evidence of hole-trapping/detrapping during NBTI degradation
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