C. Scott, A. Parsafar, A. El-Falou, P. Levine, K. Karim
{"title":"High dose efficiency, ultra-high resolution amorphous selenium/CMOS hybrid digital X-ray imager","authors":"C. Scott, A. Parsafar, A. El-Falou, P. Levine, K. Karim","doi":"10.1109/IEDM.2015.7409803","DOIUrl":null,"url":null,"abstract":"We demonstrate measured X-ray dose efficiency results from a 5.6-μm × 6.25-μm pixel-pitch direct-conversion amorphous selenium/CMOS hybrid X-ray imager. Compared to existing scintillator-based imagers, our approach enables up to 100× gains in DQE at spatial frequencies of 20-60 cycles/mm, which could radically accelerate bioengineering research. The measured MTF is 50% at 32 cycles/mm, corresponding to a 16-μm effective object size. We also demonstrate a MTF model which confirms experimental results with an RMS error of 0.02.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"58 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409803","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
We demonstrate measured X-ray dose efficiency results from a 5.6-μm × 6.25-μm pixel-pitch direct-conversion amorphous selenium/CMOS hybrid X-ray imager. Compared to existing scintillator-based imagers, our approach enables up to 100× gains in DQE at spatial frequencies of 20-60 cycles/mm, which could radically accelerate bioengineering research. The measured MTF is 50% at 32 cycles/mm, corresponding to a 16-μm effective object size. We also demonstrate a MTF model which confirms experimental results with an RMS error of 0.02.