{"title":"Fault simulation based on value difference","authors":"C. P. Wu, Chung-Len Lee, W. Shen","doi":"10.1109/ATS.1992.224431","DOIUrl":null,"url":null,"abstract":"The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224431","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided.<>
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