Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system

A.-K. Tiedemann, R. Heiderhoff, L. Balk, J. Phang
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引用次数: 5

Abstract

A hybrid-system consisting of a Scanning Thermal Microscope and an Environmental Scanning Electron Microscope is used to analyze directional thermal conductivity mechanisms. An electron beam stimulates locally variable hot spots, whereas a thermal probe is used as a locally resolving detector. The detected temperature oscillation strongly depends both on the local thermal conductivity and on the directivity of the heat transport within the investigated sample. This may allow analysis of linear structures like interfaces within materials.
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电子束诱导温度振荡在SThM/ esem -混合系统定性热导率分析中的应用
利用扫描热显微镜和环境扫描电子显微镜组成的混合系统分析了定向导热机理。电子束刺激局部可变的热点,而热探针用作局部分辨探测器。检测到的温度振荡强烈依赖于局部热导率和被测样品内热传递的方向性。这可能允许分析线性结构,如材料内部的界面。
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