{"title":"Minimal March tests for unlinked static faults in random access memories","authors":"Gurgen Harutunyan, V. Vardanian, Y. Zorian","doi":"10.1109/VTS.2005.56","DOIUrl":null,"url":null,"abstract":"New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"56","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.56","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 56
Abstract
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in random access memories. In particular, a new minimal March MSS test of complexity I8N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).
提出了一种新的最小三月测试算法，用于检测随机存储器中的(所有)非链接静态故障。特别是，引入了一种新的最小复杂度I8N的March MSS测试，用于检测所有实际的简单静态故障，如March SS (22N)， (S. Hamdioui, van de Goor, Rodgers, MTDT 2002)。
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
