{"title":"Behavioral design and test assistance for pipelined processors","authors":"H. Iwashita, T. Nakata, F. Hirose","doi":"10.1109/ATS.1992.224427","DOIUrl":null,"url":null,"abstract":"The authors propose a new concept in designing and testing processors. This approach generates behavioral-level test environments in VHDL for specific processor mechanisms, including automatic generations of test programs and behavioral descriptions. The authors have implemented an application to pipeline controllers.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224427","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The authors propose a new concept in designing and testing processors. This approach generates behavioral-level test environments in VHDL for specific processor mechanisms, including automatic generations of test programs and behavioral descriptions. The authors have implemented an application to pipeline controllers.<>
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