{"title":"VTS 2004 Best Panel Award","authors":"C. Wang, K. Butler","doi":"10.1109/VTS.2005.90","DOIUrl":null,"url":null,"abstract":"Each year, VTS recognizes the organizers and participants of the best panel at the previous year’s symposium. The selection is based entirely on audience feedback, as recorded on the attendee feedback forms. The audience rates each panel in various categories, including topical relevance, presentation quality, educational merit, panelist interaction, and audience participation.","PeriodicalId":268324,"journal":{"name":"23rd IEEE VLSI Test Symposium (VTS'05)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"23rd IEEE VLSI Test Symposium (VTS'05)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2005.90","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Each year, VTS recognizes the organizers and participants of the best panel at the previous year’s symposium. The selection is based entirely on audience feedback, as recorded on the attendee feedback forms. The audience rates each panel in various categories, including topical relevance, presentation quality, educational merit, panelist interaction, and audience participation.
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