Computer Simulation of Beam Extraction and Transport for Vacuum Arc Based Ion and Electron Sources

I. Litovko
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Abstract

The simulation of the extraction of charge particle beam from a vacuum arc based source has been used for investigation of the beam quality and optimization for specific application possibilities. A few examples are used to demonstrate the capabilities and limits of these simulations. The simulation can provide the basis for optimizing the extraction system and acceleration gap for source and for decreasing losses of the extracted beam
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基于真空电弧的离子和电子源的光束提取和输运的计算机模拟
从真空电弧源中提取电荷粒子束的模拟已被用于研究光束质量和优化特定应用的可能性。本文使用了几个示例来演示这些模拟的功能和局限性。仿真结果可为优化提取系统、优化源加速间隙、减小提取光束的损耗提供依据
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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