Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)

Subrat Mishra, S. Venkateswarlu, B. Vermeersch, Moritz Brunion, M. Lofrano, D. Abdi, H. Oprins, D. Biswas, O. Zografos, G. Hiblot, G. V. D. Plas, P. Weckx, G. Hellings, J. Myers, F. Catthoor, J. Ryckaert
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Abstract

Surge in compute-demand in consumer products, mobile phones, auto mobiles, datacenters for high performance computing (HPC) applications brings in major thermal challenges. This stems from growth in transistor density over the years and the associated power density increase. Advanced packaging techniques like 2.5D and 3D integration have a compounding effect. Hitting the thermal limits, not only affects the raw performance, power but also limits reliability of the product. Therefore, it has become necessary to foresee appropriate thermal solutions for target applications early in product development phase during thermal/power planning to assess viability of technology choices. In this paper, we assess the temperature distribution & anticipate cooling needs for future thermally-limited SOCs in advanced Angstrom nodes (A14 & A5). Thermal resistance breakdown from multiple sources is carried out to decouple contributions so as to explore possibility of a co-optimization of chip-package-cooling system. Some of the insights from our analysis could aid system software to do thermal aware job scheduling.
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热限制片上系统(soc)的芯片-封装-系统协同优化
消费类产品、移动电话、汽车、高性能计算(HPC)应用的数据中心的计算需求激增带来了重大的热挑战。这源于多年来晶体管密度的增长和相关功率密度的增加。先进的包装技术,如2.5D和3D集成具有复合效应。达到热极限,不仅会影响原始性能,功率,还会限制产品的可靠性。因此,在热/功率规划的产品开发阶段早期,就有必要为目标应用预见合适的热解决方案,以评估技术选择的可行性。在本文中,我们评估了先进埃斯特罗姆节点(A14和A5)中未来热限制soc的温度分布并预测了冷却需求。通过多源热阻击穿来解耦贡献,从而探索芯片封装冷却系统协同优化的可能性。从我们的分析中获得的一些见解可以帮助系统软件进行热感知作业调度。
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