J. Ida, Takayuki Mori, Yousuke Kuramoto, Takashi Horii, Takahiro Yoshida, Kazuma Takeda, H. Kasai, M. Okihara, Y. Arai
{"title":"Super steep subthreshold slope PN-body tied SOI FET with ultra low drain voltage down to 0.1V","authors":"J. Ida, Takayuki Mori, Yousuke Kuramoto, Takashi Horii, Takahiro Yoshida, Kazuma Takeda, H. Kasai, M. Okihara, Y. Arai","doi":"10.1109/IEDM.2015.7409761","DOIUrl":null,"url":null,"abstract":"We propose and demonstrate a super steep Subthreshold Slope (SS) new type SOI FET with a PN-body tied structure. It has a symmetry source and drain (S/D) structure. The device shows a super steep SS (<;6mV/dec) over 3 decades of the drain current with an ultralow drain voltage down to 0.1V. It also shows a low leakage current (below 1pA/um), a good Id-Vd characteristic and a negligible hysteresis characteristic.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409761","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26
Abstract
We propose and demonstrate a super steep Subthreshold Slope (SS) new type SOI FET with a PN-body tied structure. It has a symmetry source and drain (S/D) structure. The device shows a super steep SS (<;6mV/dec) over 3 decades of the drain current with an ultralow drain voltage down to 0.1V. It also shows a low leakage current (below 1pA/um), a good Id-Vd characteristic and a negligible hysteresis characteristic.