{"title":"Chaos In Phase Locked Loop","authors":"Ping-Ying Wang","doi":"10.1109/VDAT.2006.258110","DOIUrl":null,"url":null,"abstract":"We prove existence of chaos in phase locked loop (PLL). It is the first time that border-collision bifurcations and chaotic phenomenon in digital charge pump PLL is reported. The numerical result of behavior model is also presented to explain why the chaotic phenomenon exists in PLL. Moreover we highlight that the same chaotic phenomenon will exist in general sample hold feedback circuits","PeriodicalId":356198,"journal":{"name":"2006 International Symposium on VLSI Design, Automation and Test","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2006.258110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
We prove existence of chaos in phase locked loop (PLL). It is the first time that border-collision bifurcations and chaotic phenomenon in digital charge pump PLL is reported. The numerical result of behavior model is also presented to explain why the chaotic phenomenon exists in PLL. Moreover we highlight that the same chaotic phenomenon will exist in general sample hold feedback circuits
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