H. Yoshinaga, Y. Makita, A. Yamada, Y. Tsai, T. Iida, H. Shibata, A. Obara, T. Matsumori, S. Uekusa, K. Kainosho, O. Oda
{"title":"Photoluminescence excitation spectra from undoped InP","authors":"H. Yoshinaga, Y. Makita, A. Yamada, Y. Tsai, T. Iida, H. Shibata, A. Obara, T. Matsumori, S. Uekusa, K. Kainosho, O. Oda","doi":"10.1109/ICIPRM.1993.380616","DOIUrl":null,"url":null,"abstract":"In extremely pure InP when samples are annealed, five sharp emissions labeled by X/sub i/ (i = 1-4) and W were observed slightly below bound exciton emissions. Selectively-excited photoluminescence and photoluminescence excitation measurements were made to examine the features of these five emissions in the spectrum of annealed undoped InP. Four sharp emissions were observed below bound exciton emissions in undoped InP when samples were annealed at above 350/spl deg/C. Through low temperature photoluminescence excitation (PLE) spectroscopy, it was confirmed that these emissions are closely related with donor impurities. An additional sharp emission observed below the well-established donor-acceptor emission, denoted by W was also determined for the first time to be associated with the acceptor. It was concluded that PLE spectroscopy is a very powerful method to identify the origins of radiative transitions.<<ETX>>","PeriodicalId":186256,"journal":{"name":"1993 (5th) International Conference on Indium Phosphide and Related Materials","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1993 (5th) International Conference on Indium Phosphide and Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1993.380616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In extremely pure InP when samples are annealed, five sharp emissions labeled by X/sub i/ (i = 1-4) and W were observed slightly below bound exciton emissions. Selectively-excited photoluminescence and photoluminescence excitation measurements were made to examine the features of these five emissions in the spectrum of annealed undoped InP. Four sharp emissions were observed below bound exciton emissions in undoped InP when samples were annealed at above 350/spl deg/C. Through low temperature photoluminescence excitation (PLE) spectroscopy, it was confirmed that these emissions are closely related with donor impurities. An additional sharp emission observed below the well-established donor-acceptor emission, denoted by W was also determined for the first time to be associated with the acceptor. It was concluded that PLE spectroscopy is a very powerful method to identify the origins of radiative transitions.<>
在极纯的InP中,当样品退火时,观察到X/sub i/ (i = 1-4)和W标记的五个尖锐发射略低于束缚激子发射。用选择性激发光致发光和光致发光激发测量来考察这五种辐射在退火未掺杂InP光谱中的特征。当样品在350/spl℃以上退火时,在未掺杂的InP中观察到四个激子发射。通过低温光致发光激发(PLE)光谱,证实了这些发射与供体杂质密切相关。在已确定的供体-受体发射体下方观察到的另一个尖锐发射体,用W表示,也首次确定与受体相关。结果表明,PLE光谱是一种非常有效的识别辐射跃迁起源的方法。