Synthesis for testability of PLA based finite state machines

M. Avedillo, J. Quintana, J. L. Huertas
{"title":"Synthesis for testability of PLA based finite state machines","authors":"M. Avedillo, J. Quintana, J. L. Huertas","doi":"10.1109/ATS.1992.224409","DOIUrl":null,"url":null,"abstract":"A new procedure for the synthesis of easily testable PLA-based finite state machines is presented. All combinational irredundant crosspoint faults in the PLA implementing the combinational component of the machine are testable. The machines produced have short machine-independent justification sequences for each state. The maximum length of these sequences is nv. A unit length sequence verifies that the machine has been actually placed in the reset state after the application of the reset input. The authors have developed an algorithm which does not use fault simulation. Combinational fault simulation is introduced in order to reduce the number of test vectors needed. There is an area overhead associated to the increment in testability. These area penalties have been shown to be smaller for larger machines. The scheme reduces the area overhead of similar approaches previously reported.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224409","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

A new procedure for the synthesis of easily testable PLA-based finite state machines is presented. All combinational irredundant crosspoint faults in the PLA implementing the combinational component of the machine are testable. The machines produced have short machine-independent justification sequences for each state. The maximum length of these sequences is nv. A unit length sequence verifies that the machine has been actually placed in the reset state after the application of the reset input. The authors have developed an algorithm which does not use fault simulation. Combinational fault simulation is introduced in order to reduce the number of test vectors needed. There is an area overhead associated to the increment in testability. These area penalties have been shown to be smaller for larger machines. The scheme reduces the area overhead of similar approaches previously reported.<>
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于聚乳酸有限状态机的可测试性综合
提出了一种易于测试的基于pla的有限状态机的合成方法。实现机器组合部件的PLA中的所有组合无冗余交叉点故障都是可测试的。生成的机器对每个状态都有简短的与机器无关的证明序列。这些序列的最大长度为nv。单位长度序列验证在应用复位输入后,机器实际上已置于复位状态。作者开发了一种不使用故障模拟的算法。为了减少所需测试向量的数量,引入了组合故障仿真。与可测试性的增加相关的面积开销。对于大型机器,这些区域处罚被证明是较小的。该方案减少了先前报道的类似方法的面积开销
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Localization and aftereffect of automatic test generation A practical approach for the diagnosis of a MIMD network A complement-based fast algorithm to generate universal test sets for combinational function blocks A control constrained test scheduling approach for VLSI circuits Techniques for reducing hardware requirement of self checking combinational circuits
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1