Monitoring and control of fabrication processes for integrated optics devices

S. Ojha, R. Turner, J. Stagg, D. Boyle, G. Thompson
{"title":"Monitoring and control of fabrication processes for integrated optics devices","authors":"S. Ojha, R. Turner, J. Stagg, D. Boyle, G. Thompson","doi":"10.1109/ICIPRM.1994.328242","DOIUrl":null,"url":null,"abstract":"Fabrication of integrated optoelectronic devices, such as for WDM applications, requires reliable and controlled processing and the integration of various components such as mirrors, gratings, waveguides, lasers and detectors. We have recently reported fabrication and device characteristics of a low loss multichannel demultiplexer. One of the key elements of this device was fabrication of low loss parabolic mirrors. An RIE process based on methane, hydrogen and carbon dioxide gases was developed for etching vertical mirrors through a double heterostructure. In this paper work we report development of processes, such as controlled dry etching of detector and shallow waveguides by using laser interferometer for process control, and masked overgrowth for active passive integration.<<ETX>>","PeriodicalId":161711,"journal":{"name":"Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1994.328242","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Fabrication of integrated optoelectronic devices, such as for WDM applications, requires reliable and controlled processing and the integration of various components such as mirrors, gratings, waveguides, lasers and detectors. We have recently reported fabrication and device characteristics of a low loss multichannel demultiplexer. One of the key elements of this device was fabrication of low loss parabolic mirrors. An RIE process based on methane, hydrogen and carbon dioxide gases was developed for etching vertical mirrors through a double heterostructure. In this paper work we report development of processes, such as controlled dry etching of detector and shallow waveguides by using laser interferometer for process control, and masked overgrowth for active passive integration.<>
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集成光学器件制造过程的监测与控制
集成光电器件的制造,如波分复用应用,需要可靠和可控的加工和各种组件的集成,如反射镜、光栅、波导、激光器和探测器。我们最近报道了一种低损耗多通道解复用器的制造和器件特性。该装置的关键要素之一是制造低损耗抛物面镜。提出了一种基于甲烷、氢气和二氧化碳气体的RIE工艺,用于通过双异质结构蚀刻垂直镜面。在本文工作中,我们报告了工艺的发展,例如利用激光干涉仪控制探测器和浅波导的受控干蚀刻,以及用于主动式无源集成的掩膜过生长
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