Void-free full wafer adhesive bonding

F. Niklaus, P. Enoksson, Edvard Kälvesten, G. Stemme
{"title":"Void-free full wafer adhesive bonding","authors":"F. Niklaus, P. Enoksson, Edvard Kälvesten, G. Stemme","doi":"10.1109/MEMSYS.2000.838524","DOIUrl":null,"url":null,"abstract":"In this paper we present guidelines for void free adhesive bonding of 10 cm diameter wafers. We have systematically investigated the influence of different bonding parameters on void formation in the bond. The layer thicknesses of the tested polymer coatings are between 1 /spl mu/m and 12 /spl mu/m. The polymer material, the bonding pressure and the pre-curing time and temperature for the polymer has shown significant influence on void formation in the bond. High bonding pressure and pre-curing times/temperatures that are specific to the polymer material counteract void formation. Process parameters for achieving void-free bonds using benzocyclobutene (BCB) and photoresist coatings as adhesive materials are given. Excellent bonding results have been achieved with BCB as bonding material.","PeriodicalId":251857,"journal":{"name":"Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"39","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE Thirteenth Annual International Conference on Micro Electro Mechanical Systems (Cat. No.00CH36308)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2000.838524","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 39

Abstract

In this paper we present guidelines for void free adhesive bonding of 10 cm diameter wafers. We have systematically investigated the influence of different bonding parameters on void formation in the bond. The layer thicknesses of the tested polymer coatings are between 1 /spl mu/m and 12 /spl mu/m. The polymer material, the bonding pressure and the pre-curing time and temperature for the polymer has shown significant influence on void formation in the bond. High bonding pressure and pre-curing times/temperatures that are specific to the polymer material counteract void formation. Process parameters for achieving void-free bonds using benzocyclobutene (BCB) and photoresist coatings as adhesive materials are given. Excellent bonding results have been achieved with BCB as bonding material.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
无空隙全晶圆胶粘接
在本文中,我们提出了10厘米直径的晶圆的无空隙粘接的指导方针。我们系统地研究了不同的键合参数对键中孔洞形成的影响。所测聚合物涂层的层厚在1 /spl mu/m ~ 12 /spl mu/m之间。聚合物材料、键合压力、预固化时间和预固化温度对键合中的孔隙形成有显著影响。聚合物材料特有的高粘合压力和预固化时间/温度可以抵消空隙的形成。给出了以苯并环丁烯(BCB)和光抗蚀剂涂层为粘结材料实现无空隙键的工艺参数。以BCB为键合材料,取得了良好的键合效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A normally closed in-channel micro check valve Direct writing for three-dimensional microfabrication using synchrotron radiation etching Development of chain-type micromachine for inspection of outer tube surfaces (basic performance of the 1st prototype) An electrostatically excited 2D-micro-scanning-mirror with an in-plane configuration of the driving electrodes Glass- to-glass anodic bonding for high vacuum packaging of microelectronics and its stability
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1