{"title":"First steps toward ageing simulation of complex analogue circuits with behavioural modelling","authors":"F. Marc, Y. Danto","doi":"10.1109/IRWS.2005.1609581","DOIUrl":null,"url":null,"abstract":"This paper presents an original approach for ageing simulation of electronic circuits and systems. This approach is based on the use of an analogue and mixed signal hardware description language (VHDL-AMS) that make possible a behavioural description of the circuit including electrically-dependant ageing phenomena.","PeriodicalId":214130,"journal":{"name":"2005 IEEE International Integrated Reliability Workshop","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Integrated Reliability Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.2005.1609581","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents an original approach for ageing simulation of electronic circuits and systems. This approach is based on the use of an analogue and mixed signal hardware description language (VHDL-AMS) that make possible a behavioural description of the circuit including electrically-dependant ageing phenomena.