General compact model for bit-rate limit of electrical interconnects considering DC resistance, skin effect and surface scattering

Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729) Pub Date : 2004-06-07 DOI:10.1109/IITC.2004.1345727

R. Sarvari, A. Naeemi, J. Meindl

引用次数: 8

Abstract

Compact models are presented for the bit-rate limit of transmission lines using a general form of resistance that for the first time simultaneously considers dc resistance, skin effect, and surface scattering. A conventional approximation that is only valid for fast rising signals is also relaxed. In contrast to previous models, it is shown that the bit-rate limit of a transmission line is not independent of wire perimeter-to-length ratio or scale-invariant. It is also shown that the error of previous models is large (e.g. 80% for bit-rate limit equals reciprocal time of flight) if bit-rate limit is not considerably larger than the reciprocal time-of-flight.

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考虑直流电阻、集肤效应和表面散射的电气互连比特率极限的通用紧凑模型

采用一种同时考虑直流电阻、趋肤效应和表面散射的一般电阻形式，提出了传输线比特率极限的紧凑模型。仅对快速上升信号有效的传统近似也被放宽。与先前的模型相比，该模型表明传输线的比特率极限与线的周长比或尺度不变无关。如果比特率极限不明显大于飞行时间的倒数，则先前的模型误差很大(例如，比特率极限等于飞行时间的倒数)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729)

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