J. Suehle, R. Lacoe, L. Stout, Chadwin D. Young, Chittoor Parthasarathy, G. Ribes, Siddarth A. Krishnan, D. Tanner, Dimitris Ioannou, A. Modelli, Nitish Mathur, Yuan Chen, L. Westergard, E. Hammerl, M. Impronta, G. Alers, G. Tao, A. Turner, M. Ogas, C. Christiansen, E. Bouyssou, R. Degraeve, T. Sullivan, X. Federspiel, Julien Micheon, M. Ruat, M. Bailon, P. Gaitonde, B. Knowlton, Yuwen Chen, R. Vollertsen, G. Lucovsky, J. Conley, P. Lenahan, David Catlett, G. Goffman, Bill Tonti, Y. Nelson, Sharad Prasad, R. Southwick, J. Ryan, Françoise Marc, James Chen, R. Vollertsen
{"title":"2005 IIR Attendees","authors":"J. Suehle, R. Lacoe, L. Stout, Chadwin D. Young, Chittoor Parthasarathy, G. Ribes, Siddarth A. Krishnan, D. Tanner, Dimitris Ioannou, A. Modelli, Nitish Mathur, Yuan Chen, L. Westergard, E. Hammerl, M. Impronta, G. Alers, G. Tao, A. Turner, M. Ogas, C. Christiansen, E. Bouyssou, R. Degraeve, T. Sullivan, X. Federspiel, Julien Micheon, M. Ruat, M. Bailon, P. Gaitonde, B. Knowlton, Yuwen Chen, R. Vollertsen, G. Lucovsky, J. Conley, P. Lenahan, David Catlett, G. Goffman, Bill Tonti, Y. Nelson, Sharad Prasad, R. Southwick, J. Ryan, Françoise Marc, James Chen, R. Vollertsen","doi":"10.1109/irws.2005.1609601","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":214130,"journal":{"name":"2005 IEEE International Integrated Reliability Workshop","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Integrated Reliability Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/irws.2005.1609601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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