{"title":"Spatial distribution of charge carrier temperature and lifetime in semi-insulating InP:Fe, observed via photoluminescence spectroscopy","authors":"S. Waldmuller, M. Lang, P. Wellmann, A. Winnacker","doi":"10.1109/ICIPRM.1994.328209","DOIUrl":null,"url":null,"abstract":"The authors determine the minority carrier lifetime (/spl tau/) in semi-insulating InP in an indirect way by analyzing the high energy tail of the photoluminescence spectrum and extracting a charge carrier temperature T/sub e/ from this data. T/sub e/ turns out to be directly related to /spl tau/, being small for large /spl tau/ and vice versa. It is shown that a) variations of the electron temperature can be observed in typical sample of LEC-grown InP:Fe, b) these variations can be analyzed in terms of charge carrier lifetimes, c) these temperature (and lifetime) variations can be correlated with the PL-intensity distribution and the Fe-distribution in the material.<<ETX>>","PeriodicalId":161711,"journal":{"name":"Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE 6th International Conference on Indium Phosphide and Related Materials (IPRM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1994.328209","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The authors determine the minority carrier lifetime (/spl tau/) in semi-insulating InP in an indirect way by analyzing the high energy tail of the photoluminescence spectrum and extracting a charge carrier temperature T/sub e/ from this data. T/sub e/ turns out to be directly related to /spl tau/, being small for large /spl tau/ and vice versa. It is shown that a) variations of the electron temperature can be observed in typical sample of LEC-grown InP:Fe, b) these variations can be analyzed in terms of charge carrier lifetimes, c) these temperature (and lifetime) variations can be correlated with the PL-intensity distribution and the Fe-distribution in the material.<>
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