Issues in fault modelling and testing of micropipelines

S. Pagey, S. Sherlekar, G. Venkatesh
{"title":"Issues in fault modelling and testing of micropipelines","authors":"S. Pagey, S. Sherlekar, G. Venkatesh","doi":"10.1109/ATS.1992.224446","DOIUrl":null,"url":null,"abstract":"Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"10 8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25

Abstract

Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.<>
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
微管道故障建模与测试问题
Ivan Sutherland(1989)提出的微管道形成了异步实现流水线电路的优雅方案。对微管道的故障行为进行了分析,并提出了检测方案。他们认为,微管道的控制部分在正常运行时可以同时进行测试,数据部分逻辑的测试模式生成可以简化为组合电路的测试模式生成,只需在测试应用方法中进行简单的修改。测试锁存器需要双模式测试,可以使用组合电路的测试模式生成技术生成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Localization and aftereffect of automatic test generation A practical approach for the diagnosis of a MIMD network A complement-based fast algorithm to generate universal test sets for combinational function blocks A control constrained test scheduling approach for VLSI circuits Techniques for reducing hardware requirement of self checking combinational circuits
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1