{"title":"Discussion Groups (DG) and Special Interest Group (SIG) Summary Reports","authors":"Y. Nelson","doi":"10.1109/IRWS.2005.1609595","DOIUrl":null,"url":null,"abstract":"The special interest group discussed the following topics : stress temperature conditions; Kelvin test structures; via chains; and proper choice of upper and lower metal connections","PeriodicalId":214130,"journal":{"name":"2005 IEEE International Integrated Reliability Workshop","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 IEEE International Integrated Reliability Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.2005.1609595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The special interest group discussed the following topics : stress temperature conditions; Kelvin test structures; via chains; and proper choice of upper and lower metal connections
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