Reliability framework in a fabless-foundry environment

Abstract

A collaborative framework is presented to address the reliability challenges faced in a fabless-foundry environment. Examples are given to show the effectiveness of this framework for both infant mortality and long-term reliability risk. Through design-for-reliability, optimum process standardization and selective customization, defect density reduction and electrical screening, reliability of the highest level has been achieved in FPGA devices suitable for enterprise, automotive and aerospace applications, all in a fabless-foundry environment.