Dingming Yang, Jiahao Xue, Jing Wang, Hao Wang, Shulong Wang, Xiaoyi Lei*, Junfeng Yan and Wu Zhao,
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引用次数: 0
Abstract
Current overshoot in resistive random access memory (RRAM) can affect the stability and increase the power consumption of devices, which has become a great challenge in RRAM applications. In this study, we analyzed current overshoot in Ti/ZrO2/Pt devices and proposed a solution to improve device stability through high-temperature forming. The analysis results indicate that current overshoot is likely to occur in the RESET process when the SET voltage is too high, and temperature has an important impact on the conversion voltage of the Ti/ZrO2/Pt devices. Moreover, we established an electrothermal coupling model of the devices based on the oxygen vacancy conduction mechanism by COMSOL, which could obtain the distribution of the oxygen vacancy concentration in the dielectric layer during resistance conversion at different temperatures and electric fields. Based on the above analysis, by forming at high temperature, the overshoot current is reduced, and the stability of the switching voltage is improved successfully.
期刊介绍：
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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