Exploring the radiant impact of irradiance on the electrical resistance of organic thin film

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Reliability Pub Date : 2024-08-08 DOI:10.1016/j.microrel.2024.115474
M. Khan , M. Shah , M. Abbas , Asma A. Alothman , Saikh M. Wabaidur , Mohd. Zahid Ansari
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Abstract

This article reports on the light sensitivity of Organic Thin Film Transistors (OTFTs) based on Nickel Phthalocyanine (NiPc). Phototransistors with three distinct channel lengths (25 μm, 40 μm, and 50 μm) are fabricated and compared for performance analysis. We investigate the impact of irradiance at various frequencies under different applied voltages on the performance of the phototransistor. Light exposure influences the resistance of nickel-phthalocyanine. The resistance of nickel-phthalocyanine undergoes a decrement, ranging from 185 to 0.8 KΩ, as the incident light intensity increases from zero to 130 foot candela (fc), while varying the frequency from 0.1 to 5 KHz. Under conditions of low frequency (100 Hz) and a channel length of 25 μm, the resistance of the fabricated photosensitive transistor exhibits a decrease from 92 to 40 KΩ during a voltage sweep of 5 V. The resistance of the organic phototransistor (OPT) is noted to decrease with rising irradiance, and its performance is superior at low frequencies compared to high frequencies. The decrease in resistance is attributed to the bound charge carriers that get sufficient energy from the absorbed photon to surmount the barrier when the incident light on the device possesses enough energy. These liberated conduction electrons, or holes left behind, move freely, resulting in lower resistance. The obtained results demonstrate the potential efficiency of organic photosensitive transistors for utilization in optoelectronic devices.

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探索辐照度对有机薄膜电阻的影响
本文报告了基于酞菁镍(NiPc)的有机薄膜晶体管(OTFT)的光敏感性。我们制作了三种不同沟道长度(25 μm、40 μm 和 50 μm)的光电晶体管,并对其进行了性能分析比较。我们研究了不同应用电压下各种频率的辐照度对光晶体管性能的影响。光照射影响镍酞菁的电阻。当入射光强度从零增加到 130 英尺坎德拉(f),频率从 0.1 到 5 千赫不等时,镍酞菁的电阻会下降,降幅从 185 到 0.8 千欧不等。在低频(100 Hz)和通道长度为 25 μm 的条件下,制造的光敏晶体管的电阻在 5 V 电压扫描期间从 92 KΩ 下降到 40 KΩ。有机光敏晶体管(OPT)的电阻随着辐照度的升高而减小,其低频性能优于高频。电阻减小的原因是,当入射光具有足够的能量照射到器件上时,束缚电荷载流子从吸收的光子中获得了足够的能量,从而越过了势垒。这些被释放的传导电子或留下的空穴可以自由移动,从而降低了电阻。研究结果证明了有机光敏晶体管在光电设备中的潜在应用效率。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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