M. Khan , M. Shah , M. Abbas , Asma A. Alothman , Saikh M. Wabaidur , Mohd. Zahid Ansari
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引用次数: 0
Abstract
This article reports on the light sensitivity of Organic Thin Film Transistors (OTFTs) based on Nickel Phthalocyanine (NiPc). Phototransistors with three distinct channel lengths (25 μm, 40 μm, and 50 μm) are fabricated and compared for performance analysis. We investigate the impact of irradiance at various frequencies under different applied voltages on the performance of the phototransistor. Light exposure influences the resistance of nickel-phthalocyanine. The resistance of nickel-phthalocyanine undergoes a decrement, ranging from 185 to 0.8 KΩ, as the incident light intensity increases from zero to 130 foot candela (fc), while varying the frequency from 0.1 to 5 KHz. Under conditions of low frequency (100 Hz) and a channel length of 25 μm, the resistance of the fabricated photosensitive transistor exhibits a decrease from 92 to 40 KΩ during a voltage sweep of 5 V. The resistance of the organic phototransistor (OPT) is noted to decrease with rising irradiance, and its performance is superior at low frequencies compared to high frequencies. The decrease in resistance is attributed to the bound charge carriers that get sufficient energy from the absorbed photon to surmount the barrier when the incident light on the device possesses enough energy. These liberated conduction electrons, or holes left behind, move freely, resulting in lower resistance. The obtained results demonstrate the potential efficiency of organic photosensitive transistors for utilization in optoelectronic devices.
期刊介绍:
Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.
Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.