Investigation on FCBGA package with vertical-aligned carbon fiber thermal pad as thermal interface material

IF 1.9 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Reliability Pub Date : 2025-02-11 DOI:10.1016/j.microrel.2025.115607
Mingming Yi, Yiou Qiu, Ping Wu, Guoliao Sun, Wenhui Zhu, Liancheng Wang
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Abstract

Flip chip ball grid array (FCBGA) is the current main packaging form of CPU and GPU. With the miniaturization and intelligence of artificial intelligence chips, chip power consumption of FCBGA continues to increase (the power consumption of H100 has exceeded 800 W) and the heat dissipation problem has become increasingly serious. In the heat dissipation system of the entire chip, the thermal conductivity of thermal interface material (TIM) is a key bottleneck that limits the improvement of FCBGA package heat dissipation capability. Currently commercial TIMs such as X-23 have a thermal conductivity of 3.8–6 W/MK, which is not enough to cope with the high heat dissipation needs of existing FCBGAs. In this article, we introduced oriented carbon fibers into a silicone oil matrix to prepare a thermal pad with a thermal conductivity of 21.0 W/mK, and used it as TIM1 in FCBGA package. By optimization the key process including lid attach, dicing saw and package structure design, coverage rate reached 88.22 % after packaged. Thermal simulation shows that replace TIM in FCBGA from X-23 to homemade thermal pad, junction temperature (Tj) is reduced from 69.9 to 66.8 °C. In addition, reliability test was used carried out on FCBGA packaged incorporating carbon fiber thermal pad as TIM.
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垂直定向碳纤维热垫作为热界面材料的FCBGA封装研究
倒装芯片球栅阵列(FCBGA)是目前CPU和GPU的主要封装形式。随着人工智能芯片的小型化和智能化,FCBGA的芯片功耗不断增加(H100的功耗已超过800w),散热问题日益严重。在整个芯片的散热系统中,热界面材料(TIM)的导热性能是限制FCBGA封装散热能力提升的关键瓶颈。目前商用TIMs如X-23的导热系数为3.8-6 W/MK,不足以满足现有FCBGAs的高散热需求。本文将定向碳纤维引入硅油基体中,制备导热系数为21.0 W/mK的热垫,并将其作为TIM1用于FCBGA封装。通过对盖贴、切片锯、包装结构设计等关键工艺进行优化,包装后的覆盖率达到88.22%。热仿真结果表明,将X-23中的TIM替换为自制热垫后,结温(Tj)由69.9℃降至66.8℃。此外,还对采用碳纤维热垫作为TIM的FCBGA封装进行了可靠性测试。
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来源期刊
Microelectronics Reliability
Microelectronics Reliability 工程技术-工程:电子与电气
CiteScore
3.30
自引率
12.50%
发文量
342
审稿时长
68 days
期刊介绍: Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged. Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.
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