The Study of Electrical Conductivity and Dielectric Relaxation in the Organic Ferroelectric Diisopropylammonium Iodide (dipaI)

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-11-16 DOI:10.1007/s10854-024-13845-1
Mamataj Khatun, Ekramul Kabir
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Abstract

In this work, we delve into the dielectric response and electrical conductivity behavior of the innovative organic ferroelectric Diisopropylammonium Iodide (dipaI), with a focus on power dispersion and the universal relaxation law. We employ impedance spectroscopy, dielectric relaxation, and AC conductivity analyses across a broad spectrum of temperatures (343 K to 443 K) and frequencies (1 kHz to 20 MHz). Using the Maxwell–Wagner capacitor model, we elucidate the complex impedance using an equivalent circuit. In the equivalent circuit, elements like resistors and capacitors are arranged in a series and parallel configuration to represent the dielectric and conductive characteristics of the material. By analyzing the impedance spectrum using this model, we distinguish between the contributions from grain interiors and grain boundaries. The investigation of dielectric relaxation involves the importance of the Havriliak-Negami (HN) formula to interpret experimental findings. Unlike simpler models like the Debye relaxation, which assumes a single, discrete relaxation time, the HN formula accounts for a distribution of relaxation times, providing a more nuanced description of how polarization evolves over time. Additionally, the universal power law utilizes the parameter 'n' to describe the behavior of the electrical conductivity on the frequency, which is predicated on the hopping of charge carriers over potential barriers.

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有机铁电体二异丙基碘化铵(dipaI)的导电性和介电弛豫研究
在这项工作中,我们深入研究了创新型有机铁电体二异丙基碘化铵(dipaI)的介电响应和导电行为,重点是功率分散和普遍弛豫定律。我们采用阻抗光谱法、介电弛豫法和交流电导率分析法,在广泛的温度(343 K 至 443 K)和频率(1 kHz 至 20 MHz)范围内进行分析。利用 Maxwell-Wagner 电容器模型,我们使用等效电路阐明了复合阻抗。在等效电路中,电阻器和电容器等元件以串联和并联配置排列,以表示材料的介电和导电特性。通过使用该模型分析阻抗谱,我们可以区分晶粒内部和晶粒边界的贡献。介电弛豫的研究涉及到 Havriliak-Negami(HN)公式对解释实验结果的重要性。与假设单一、离散弛豫时间的德拜弛豫等简单模型不同,HN 公式考虑了弛豫时间的分布,对极化如何随时间演变提供了更细致的描述。此外,通用幂律利用参数 "n "来描述电导率在频率上的行为,而这是以电荷载流子在势垒上的跳跃为前提的。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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