{"title":"Global Least Squares Algorithm for 3D Elemental Surface Topography Reconstruction Using Quad-Segment Detector in X-ray Spectrometry.","authors":"Ebrahim Gholami Hatam, Primož Pelicon","doi":"10.1093/mam/ozae138","DOIUrl":null,"url":null,"abstract":"<p><p>2D elemental imaging techniques such as micro-X-ray fluorescence (micro-XRF) and micro-particle-induced X-ray emission (micro-PIXE) play a critical role in elemental mapping across diverse fields such as biology, geology, materials science, and engineering. However, surface irregularities often introduce shadow effects, hindering accurate spectrometric analysis. Knowing the topography information is essential for addressing this issue. Here, we propose integrating a global least squares algorithm for reconstructing the 3D surface topography in micro-PIXE analysis which is applicable in other similar techniques based on X-ray microscopy. This algorithm utilizes two independent gradient components, distorted by noise, to calculate the gradient vector from X-ray data acquired by an annular quad-segment spectrometer. We demonstrate the capability of this approach on a real homogeneous sample, yielding 3D elemental surface topography. This noniterative code provides surface reconstructions which in turn could find application to enhance the correction of spatial elemental distributions across heterogeneous sample types.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":""},"PeriodicalIF":2.9000,"publicationDate":"2025-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy and Microanalysis","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/mam/ozae138","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
2D elemental imaging techniques such as micro-X-ray fluorescence (micro-XRF) and micro-particle-induced X-ray emission (micro-PIXE) play a critical role in elemental mapping across diverse fields such as biology, geology, materials science, and engineering. However, surface irregularities often introduce shadow effects, hindering accurate spectrometric analysis. Knowing the topography information is essential for addressing this issue. Here, we propose integrating a global least squares algorithm for reconstructing the 3D surface topography in micro-PIXE analysis which is applicable in other similar techniques based on X-ray microscopy. This algorithm utilizes two independent gradient components, distorted by noise, to calculate the gradient vector from X-ray data acquired by an annular quad-segment spectrometer. We demonstrate the capability of this approach on a real homogeneous sample, yielding 3D elemental surface topography. This noniterative code provides surface reconstructions which in turn could find application to enhance the correction of spatial elemental distributions across heterogeneous sample types.
期刊介绍:
Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.