Heon C. Kim, Dong-Soon Yi, Jin-Young Park, Chang-hyun Cho
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引用次数: 51
Abstract
This paper presents an efficient repair algorithm for embedded memory with multiple redundancies and a BISR (built-in self-repair) circuit using the proposed algorithm. While there are many repair algorithms which have good repair capability, their complexity is too high to implement. We present a repair algorithm which has good repair capability with little hardware overhead.
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