{"title":"单悬浮InGaAs纳米线mosfet","authors":"C. Zota, L. Wernersson, E. Lind","doi":"10.1109/IEDM.2015.7409808","DOIUrl":null,"url":null,"abstract":"We report on In<sub>0.85</sub>Ga<sub>0.15</sub>As NWFETs utilizing a single suspended (above the substrate) selectively grown nanowire as the channel. These devices exhibit g<sub>m</sub> = 3.3 mS/μm and subthreshold slope SS = 118 mV/dec, both at V<sub>DS</sub> = 0.5 V and L<sub>G</sub> = 60 nm. This is the highest reported value of gm for all MOSFETs and HEMTs, as well as a strong combination of on and off performance, with Q = g<sub>m</sub>/SS = 28, the highest for non-planar III-V MOSFETs.","PeriodicalId":336637,"journal":{"name":"2015 IEEE International Electron Devices Meeting (IEDM)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Single suspended InGaAs nanowire MOSFETs\",\"authors\":\"C. Zota, L. Wernersson, E. Lind\",\"doi\":\"10.1109/IEDM.2015.7409808\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on In<sub>0.85</sub>Ga<sub>0.15</sub>As NWFETs utilizing a single suspended (above the substrate) selectively grown nanowire as the channel. These devices exhibit g<sub>m</sub> = 3.3 mS/μm and subthreshold slope SS = 118 mV/dec, both at V<sub>DS</sub> = 0.5 V and L<sub>G</sub> = 60 nm. This is the highest reported value of gm for all MOSFETs and HEMTs, as well as a strong combination of on and off performance, with Q = g<sub>m</sub>/SS = 28, the highest for non-planar III-V MOSFETs.\",\"PeriodicalId\":336637,\"journal\":{\"name\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Electron Devices Meeting (IEDM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2015.7409808\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Electron Devices Meeting (IEDM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2015.7409808","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We report on In0.85Ga0.15As NWFETs utilizing a single suspended (above the substrate) selectively grown nanowire as the channel. These devices exhibit gm = 3.3 mS/μm and subthreshold slope SS = 118 mV/dec, both at VDS = 0.5 V and LG = 60 nm. This is the highest reported value of gm for all MOSFETs and HEMTs, as well as a strong combination of on and off performance, with Q = gm/SS = 28, the highest for non-planar III-V MOSFETs.